Components testing services
Poseico shape

Components testing services

A COMPLETE SET OF KNOW HOW, METHODS, EQUIPMENTS AND TESTERS FOR:

High power semiconductors characterization

Natural air, forced air and liquid cooled heatsink characterization

Contact surfaces quality evaluation

Power assemblies characterization

APPLICATIONS

Routine tests

Type tests

Tests reliability

Failure analysis

Authenticity tests

Poseico shape
ROUTINE AND TYPE TESTS OF POWER SEMICONDUCTORS
DEVICESTYPE OF TESTCAPABILITYTEMPERATURE RANGE
Diodes Press-pack
Thyristors press-pack
GTO Press -pack
Diodes insulated module
Thyristors insulated
Repetitive and non repetitive on-state and reverse up to 7 kV;
400 mA;
-70 °C ÷ +190 °C
On state voltage up to 10 V; 10 kA +25 °C ÷ +190 °C
Recovery characteristics I = 10 ÷ 4000 A;
diI/dt = 0.4 ÷ 1000 A/μs;
VR = 10 ÷ 100 V;
+25 °C ÷ +190 °C
Press-pack Thyristors
Insulated Module Thyristors
Trigger characteristics-70 °C ÷ +190 °C
Turn off
dv/dt
I = 10 ÷ 4000 A;
di/dt = 0.4 ÷ 300 A/μs;
VR = 10 ÷ 100 V;
VD = 200 ÷ 3000 V;
dv/dt = 20 ÷ 2000 V/μs;
+25 °C ÷ +140 °C
Press-pack GTOsDynamic characteristicsup to IT=3500 A;
VD = 4500 V
+25 °C ÷ +120 °C
Press-pack IGBTs
Insulated Module IGBTs
Static characteristicsup to 7 kV;
up to 6 kA
+25 °C ÷ +150 °C
Press-pack Diodes
Press-pack Thyristors
Press-pack GTOs
Press-pack IGBTs
Sealing testsMass spectrometer,
Tracer gas: He
+25 °C
Press-pack Diodes
Press-pack Thyristors
Press-pack GTOs
Insulated Module Diodes
Insulated Module Thyristors
Surge tests1 kA - 70 kA
with or without reverse
voltage reapplied
+25 °C ÷ +175 °C
Press-pack Devices and Insulated ModulesHigh temperature blocking life testup to 6 kV+80 °C ÷ +150 °C
Press-pack DevicesThermal resistance junction - heatsink tests
ROUTINE AND TYPE TESTS OF POWER ASSEMBLIES
TYPE OF TESTEQUIPMENTCAPABILITY
Input regulator for power assemblies testing areaThree phases high power variable voltage supply0 ÷ 400 V (120 kVA)
No load high voltage testThree phases high voltage supply0 ÷ 3 kV (50 kVA); 0 ÷ 8 kV (3,5 kVA)
High current supply for thermal tests on rectifier bridgeThree phases high current supplycontinous current up 10 kA (75 kVA)
1 min pulse 16 kA
Insulation testsElectric strength voltage test equipmentup to 25 kV
Source of DC voltage equivalent to railway lineDC voltage supplyup to 4 kV - 30 A or 400 V - 300 A
Source for DC link supplyAdjustable high voltage power supplyup to 10 kV, 1A
Static and dynamic test for power modules and assembliesMultitester for module and assembliesStatic 6000 V; 1000 A
Dynamic 2000 V; 1000 A
MECHANICHAL TESTS OF POWER SEMICONDUCTORS AND POWER ASSEMBLIES
TYPE OF TESTEQUIPMENTCAPABILITY
DimensionalMicrometer0,001 mm
Visual inspectionOptic microscope1000 x
RugosityRoughness testerup to Ra = 0,4
FlatnessFlatness tester0,001 mm
Thickness of plating layerFischerscope X-raysDifferent plating layers and substrates
RELIABILITY TESTS OF POWER SEMICONDUCTORS
TEST CONDITIONTYPYCAL TEST DURATION
DimensionalMicrometer0,001 mm
Visual inspectionOptic microscope1000 x
RugosityRoughness testerup to Ra = 0,4
FlatnessFlatness tester0,001 mm
Thickness of plating layerFischerscope X-raysDifferent plating layers and substrates
RELIABILITY TESTS OF POWER SEMICONDUCTORS
TEST CONDITIONTYPYCAL TEST DURATION
Thermal power cycling testsSine wave current 50 Hz
∆ T = 70 – 80 °C
I conduction (A) = up to 3000 A
Cooled by water flow
t cycle (s) = from 1 sec to 10 mins
Higher than 1000 cycles
High temperature blocking life testSine wave voltage 50 Hz
Tj = Tj max
V = 0.8 VDRM (VRRM)
T = 4 - 168 h
High temperature storage testT (°C) = high value of storage
Temperature (up to 200 °C)
T = 168 h
Low temperature store testT (°C) = low value of storage
Temperature (down to -70 °C)
T = 168 h
Passive cycling testThi = 150 °C
Tlo = -70 °C
10 cycles

FAILURE ANALYSIS ON HIGH POWER SEMICONDUCTORS

Poseico may perform a failure analysis on failed devices (press-pack or insulated module devices) in order to evaluate the potential failure causes occurred during the device operation on field. Thanks to its own database, Poseico may provide a quick and deep evaluation of failure conditions and perform specific laboratory tests (mechanical and electrical) to help the Customer to mitigate potential wrong working conditions of the final application.

AUTHENTICITY CHECKS

Counterfeit goods span across multiple industries including the Power Electronics one. Poseico is fighting against this unpolite competition and it offers a complete service in order to analyze if semiconductors, branded Poseico or other, are original or fake.

MOUNTING RECOMMENDATIONS

In order to ensure effective cooling, good current conduction and reliability, in the assembly of Power Semiconductors, it’s important to observe some recommendations with a particular focus on heatsink preparation and clamping system. The recommended procedure is reported below:

USING BAR CLAMPING SYSTEM

  • - clean the mounting area (a) of both heatsinks before with “abrasive rubber” and than with alcohol.
  • - clean the mounting surfaces of the semiconductor with alcohol.
  • - apply a thin film of mounting grease (b) on both mounting surfaces of the heatsinks.
  • - put the semiconductor between the two heatsinks and rotate it to spread the contact grease.

CAUTION: each guide pin should be located in the center hole.

  • - pre-assemble the clamp housing if necessary
  • - place the pre-assembled portion of the clamp through the heatsink and the semiconductor assembly.
  • - place over the upper heatsink the second part of the clamp, equipped with its spring system and hardware parts.
  • - tighten by “fingers” the screws and put all the assembly in position.

CAUTION: all the surfaces must be parallel before tightening.

  • - tighten the screws half a turn until the pressure indicating system shows that the required pressure has been achieved.

USING BOX CLAMPING SYSTEM

  • - clean the mounting area (a) of both heatsinks before with “abrasive rubber” and than with alcohol.
  • - clean the mounting surfaces of the semiconductor with alcohol.
  • - apply a thin firm of mounting grease (b) on the surfaces of the device.
  • - put the box clamp over the device ensuring that the pins are correctly located.
  • - put the square steel plate over the central rod, putting bolts through the clamp whilst holding it firmly in place.
  • - screw the bolts “finger tight” then alternatively, clockwise, half a turn until the box touches the heatsink all the way round.

CAUTION: use a torque wrench to apply the right clamping force.

  • (a) recommended tolerances over the device mounting area: flatness 30 micron, roughness 2 micron
  • (b) recommended mounting grease: contactal hpg Note: before mounting the assembly, a leakage test must be performed to verify the electrical integrity.

Maximum allowable average current

In this catalogue the average current ratings are mostly specified for temperatures of: Th = 55°C. Tc = 85°C at 180° sine wave. For other temperatures, the current can be calculated using the following formulas applicable up to 400 Hz:

testing
  • I(AV) = IT(AV) for thyristors, IF(AV) for diodes
  • Vo = VT(TO) for thyristors, VF(TO) for diodes
  • T = Tc or Th
  • Rth = Rth(j - c) or Rth(j - h)
  • r = rT for thyristors, rF for diodes
  • K = 1 for direct current
  • K = (π /2) for 180° sine wave
  • K = √3 for 120° rectangular wave
  • K = √2 for 160° rectangular wave